基本信息:
- 专利标题: SYSTEM AND METHOD FOR OPTICAL MEASUREMENTS ON A TRANSPARENT SHEET
- 专利标题(中):用于透明片材上的光学测量的系统和方法
- 申请号:PCT/EP2016/080685 申请日:2016-12-12
- 公开(公告)号:WO2017098053A1 公开(公告)日:2017-06-15
- 发明人: ABEN, Gerardus , THEISS, Wolfgang
- 申请人: DSM IP ASSETS B.V.
- 申请人地址: Het Overloon 1 6411 TE Heerlen NL
- 专利权人: DSM IP ASSETS B.V.
- 当前专利权人: DSM IP ASSETS B.V.
- 当前专利权人地址: Het Overloon 1 6411 TE Heerlen NL
- 代理机构: HANSEN, Jesper
- 优先权: EP15199656.8 20151211
- 主分类号: G01N21/47
- IPC分类号: G01N21/47 ; G01N21/86 ; G01N21/896 ; G01N21/84 ; G01J1/06 ; G01N21/59
摘要:
The invention relates to a system for measuring light transmission and/or light reflection properties of a transparent sample sheet (S), the system comprising a detection assembly and a control unit (10), wherein the detection assembly comprises an integrating sphere (1) having a sample port (2), an illumination port, a detection port, an internal light source (4) positioned at the illumination port, and a photodetector (3) coupled to a spectrometer and positioned at the detection port; means to detect radiation coming either directly from the sample port or from the wall of the integrating sphere or both directly from the sample port and from the wall of the integrating sphere, e.g. movable baffle (8); an external light source (5) or a transmittance detector axially aligned with the sample port; means to illuminate with the internal light source or with the external light source if present or with no light source; a reference standard (9), and means to position it at and from the sample port. This system is relatively compact, and can advantageously be used at existing sheet production lines for process and quality control. The invention also relates to a method for measuring light transmission and/or light reflection properties of a transparent sample sheet that applies said system; and to processes of making a sheet, especially an AR-coated glass sheet, comprising said method.
摘要(中):
本发明涉及用于测量透明样品片(S)的光透射和/或光反射特性的系统,该系统包括检测组件和控制单元(10),其中检测 组件包括具有样品端口(2),照射端口,检测端口,定位在照射端口处的内部光源(4)和耦合到光谱仪的光检测器(3)的积分球(1) 检测口; 用于检测直接来自样品端口或来自积分球的壁的辐射,或者直接来自样品端口和来自积分球的壁的辐射,例如, 活动挡板(8); 外部光源(5)或与样品端口轴向对齐的透射率检测器; 用内部光源或用外部光源(如果存在或不用光源)照明的装置; 参考标准(9),以及将其定位在样品端口和从样品端口定位的方法。 该系统相对紧凑,并且可以有利地用于现有的片材生产线以用于过程和质量控制。 本发明还涉及用于测量应用所述系统的透明样品片的光透射和/或光反射性质的方法; 并涉及制造包括所述方法的片材,特别是AR涂布的玻璃片材的方法。 p>
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/47 | ..散射,即漫反射 |