发明申请
WO2016053676A1 CONTROLLED-CONTACT METHOD OF MEASURING INSERTION LOSS IN OPTICAL FIBER CONNECTORS
审中-公开
基本信息:
- 专利标题： CONTROLLED-CONTACT METHOD OF MEASURING INSERTION LOSS IN OPTICAL FIBER CONNECTORS
- 专利标题（中）：光纤连接器测量插入损失的控制接触方法
- 申请号：PCT/US2015/051372 申请日：2015-09-22
- 公开(公告)号：WO2016053676A1 公开(公告)日：2016-04-07
- 发明人： FUSCO, Adam Joseph , RICKETTS, Daniel Ohen , SUTHERLAND, James Scott , VANCE, Neil David , ZAMBRANO, Elvis Alberto
- 申请人： CORNING OPTICAL COMMUNICATIONS LLC
- 申请人地址： 800 17th Street NW Hickory, North Carolina 28601 US
- 专利权人： CORNING OPTICAL COMMUNICATIONS LLC
- 当前专利权人： CORNING OPTICAL COMMUNICATIONS LLC
- 当前专利权人地址： 800 17th Street NW Hickory, North Carolina 28601 US
- 代理机构： WEEKS, Adam R.
- 优先权： US14/501,542 20140930
- 主分类号： G01M11/00
- IPC分类号： G01M11/00 ; G02B6/38
摘要：
A controlled-contact method of measuring an insertion loss of a compressible DUT having a first ferrule with a first optical fiber and a first end face is disclosed. The method utilizes a compressible reference connector having a second ferrule with a second optical fiber and a second end face. The method includes: axially aligning the first and second ferrules to define a gap with an axial gap distance of greater than 150 μm; moving the reference connector at a connector velocity in the range from 1 mm/s to 5 mm/s; when the gap distance is less than 150 μm, reducing the connector velocity to between 10 μm/s and 500 μm/s until contact while continuing to measure the coupled optical power; after contact, increasing the connector velocity as the reference and DUT connector axially compress. The insertion loss is determined from ongoing measurements of the coupled optical power.
摘要（中）：
公开了一种用第一光纤和第一端面测量具有第一套圈的可压缩DUT的插入损耗的受控接触方法。 该方法利用具有带有第二光纤和第二端面的第二套圈的可压缩参考连接器。 该方法包括：轴向对准第一和第二套圈以限定具有大于150μm的轴向间隙距离的间隙; 以1 mm / s至5 mm / s范围内的连接器速度移动参考连接器; 当间隙距离小于150μm时，将连接器速度降低到10μm/ s至500μm/ s之间，直到接触，同时继续测量耦合的光功率; 接触后，增加作为参考和DUT连接器轴向压缩的连接器速度。 插入损耗由耦合光功率的持续测量来确定。
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01M | 机器或结构部件的静或动平衡的测试；未列入其他类目的结构部件或设备的测试 |
| ------G01M11/00 | 光学设备的测试；其他类目未包括的用光学方法测试结构部件 |