基本信息:
- 专利标题: CONTROL OF EROSION PROFILE ON A DIELECTRIC RF SPUTTER TARGET
- 专利标题(中):控制电介质射频射灯目标的腐蚀特性
- 申请号:PCT/US2009059108 申请日:2009-09-30
- 公开(公告)号:WO2010045026A3 公开(公告)日:2010-07-01
- 发明人: FORSTER JOHN C , HOFFMAN DANIEL J , PIPITONE JOHN A , TANG XIANMIN , WANG RONGJUN
- 申请人: APPLIED MATERIALS INC , FORSTER JOHN C , HOFFMAN DANIEL J , PIPITONE JOHN A , TANG XIANMIN , WANG RONGJUN
- 专利权人: APPLIED MATERIALS INC,FORSTER JOHN C,HOFFMAN DANIEL J,PIPITONE JOHN A,TANG XIANMIN,WANG RONGJUN
- 当前专利权人: APPLIED MATERIALS INC,FORSTER JOHN C,HOFFMAN DANIEL J,PIPITONE JOHN A,TANG XIANMIN,WANG RONGJUN
- 优先权: US25222408 2008-10-15
- 主分类号: H01L21/203
- IPC分类号: H01L21/203
摘要:
The present invention generally includes a sputtering target assembly that may be used in an RF sputtering process. The sputtering target assembly may include a backing plate and a sputtering target. The backing plate may be shaped to have one or more fins that extend from the backing plate towards the sputtering target. The sputtering target may be bonded to the fins of the backing plate. The RF current utilized during a sputtering process will be applied to the sputtering target at the one or more fin locations. The fins may extend from the backing plate at a location that corresponds to a magnetic field produced by a magnetron that may be disposed behind the backing plate. By controlling the location where the RF current is coupled to the sputtering target to be aligned with the magnetic field, the erosion of the sputtering target may be controlled.
摘要(中):
本发明通常包括可用于RF溅射工艺中的溅射靶组件。 溅射靶组件可以包括背板和溅射靶。 背板可以被成形为具有从背板朝向溅射靶延伸的一个或多个翅片。 溅射靶可以结合到背板的翅片上。 在溅射过程中使用的RF电流将被施加到在一个或多个鳍位置处的溅射靶。 翅片可以在对应于可以设置在背板后面的磁控管产生的磁场的位置处从背板延伸。 通过控制RF电流耦合到溅射靶以与磁场对准的位置,可以控制溅射靶的侵蚀。
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
--------H01L21/02 | .半导体器件或其部件的制造或处理 |
----------H01L21/027 | ..未在H01L21/18或H01L21/34组中包含的为进一步的光刻工艺在半导体之上制作掩膜 |
------------H01L21/18 | ...器件有由周期表第Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体,如掺杂材料 |
--------------H01L21/20 | ....半导体材料在基片上的沉积,例如外延生长 |
----------------H01L21/203 | .....应用物理沉积的,例如真空沉积,溅射 |