发明申请
WO0244293A2 METHOD AND COMPOSITION FOR THE REMOVAL OF RESIDUAL MATERIALS DURING SUBSTRATE PLANARIZATION
审中-公开
基本信息:
- 专利标题: METHOD AND COMPOSITION FOR THE REMOVAL OF RESIDUAL MATERIALS DURING SUBSTRATE PLANARIZATION
- 专利标题(中):在基板平面化期间去除残留材料的方法和组合
- 申请号:PCT/US0143267 申请日:2001-11-20
- 公开(公告)号:WO0244293A2 公开(公告)日:2002-06-06
- 发明人: SUN LIZHONG , TSAI STAN , LI SHIJIAN
- 申请人: APPLIED MATERIALS INC
- 专利权人: APPLIED MATERIALS INC
- 当前专利权人: APPLIED MATERIALS INC
- 优先权: US72913200 2000-12-01
- 主分类号: B24B37/00
- IPC分类号: B24B37/00 ; C09G1/02 ; C09K3/14 ; H01L21/304 ; H01L21/306 ; H01L21/321
摘要:
A method, composition, and computer readable medium for planarizing a substrate. In one aspect, the composition includes one or more chelating agents and ions of at least one transition metal, one or more surfactants, one or more oxidizers, one or more corrosion inhibitors, and deionized water. The composition may further comprise one or more agents to adjust the pH and/or abrasive particles. The method comprises planarizing a substrate using a composition including one or more chelating agents and ions of at least one transition metal. In one aspect, the method comprises processing a substrate disposed on a polishing pad including performing a first polishing process to substantially remove the copper containing material, performing a second polishing process to remove residual copper containing material, the second polishing process comprising delivering a CMP composition to the polishing pad, mixing one or more chelating agents and ions of at least one transition metal in situ with the CMP composition, and removing residual copper containing materials from the substrate surface. The invention also provides a computer readable medium bearing instructions for planarizing a substrate surface, the instructions arranged, when executed by one or more processors, to cause one or more processors to control a system to perform polishing the substrate to substantially remove copper containing material formed thereon and polishing the substrate with a CMP composition comprising one or more chelating agents and ions of at least one transition metal to remove residual copper containing material.
摘要(中):
一种用于平坦化衬底的方法,组合物和计算机可读介质。 一方面,组合物包括一种或多种螯合剂和至少一种过渡金属的离子,一种或多种表面活性剂,一种或多种氧化剂,一种或多种腐蚀抑制剂和去离子水。 组合物还可以包含一种或多种调节pH和/或磨料颗粒的试剂。 该方法包括使用包含一种或多种螯合剂和至少一种过渡金属的离子的组合物平面化底物。 一方面,该方法包括处理设置在抛光垫上的衬底,包括执行第一抛光工艺以基本上除去含铜材料,执行第二抛光工艺以去除剩余的含铜材料,所述第二抛光工艺包括递送CMP组合物 到抛光垫,将一种或多种螯合剂和至少一种过渡金属的离子与CMP组合物原位混合,并从基材表面除去残留的含铜材料。 本发明还提供了一种用于平坦化衬底表面的指令的计算机可读介质,当由一个或多个处理器执行时,所述指令被布置成使一个或多个处理器控制系统执行抛光所述衬底以基本上去除形成的含铜材料 在其上并用包含一种或多种螯合剂和至少一种过渡金属的离子的CMP组合物抛光衬底以除去残留的含铜材料。