发明申请
WO98047177A1 NANOPOROUS DIELECTRIC FILMS WITH GRADED DENSITY AND PROCESS FOR MAKING SUCH FILMS
审中-公开
基本信息:
- 专利标题: NANOPOROUS DIELECTRIC FILMS WITH GRADED DENSITY AND PROCESS FOR MAKING SUCH FILMS
- 专利标题(英):Nanoporous dielectric films with graded density and process for making such films
- 专利标题(中):具有分级密度的纳米电介质薄膜和制作这种薄膜的方法
- 申请号:PCT/US1998/006492 申请日:1998-04-02
- 公开(公告)号:WO98047177A1 公开(公告)日:1998-10-22
- 主分类号: H01L21/316
- IPC分类号: H01L21/316 ; H01L21/768 ; H01L23/522 ; H01L23/532
摘要:
The present invention relates to nanoporous dielectric films (10) and to a process for their manufacture. A substrate having a plurality of raised lines (4) on its surface is provided with a relatively high porosity, low dielectric constant, silicon containing polymer composition (10) positioned between the raise lines (4) and a relatively low porosity, high dielectric constant, silicon containing composition (8) positioned on the lines (4).
摘要(中):
本发明涉及纳米多孔介电膜(10)及其制造方法。 在其表面上具有多个凸起线(4)的基底设置有相对高孔隙率的低介电常数,位于升高线(4)之间的含硅聚合物组合物(10)和相对较低的孔隙率,高介电常数 ,位于管线(4)上的含硅组合物(8)。
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
--------H01L21/02 | .半导体器件或其部件的制造或处理 |
----------H01L21/027 | ..未在H01L21/18或H01L21/34组中包含的为进一步的光刻工艺在半导体之上制作掩膜 |
------------H01L21/18 | ...器件有由周期表第Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体,如掺杂材料 |
--------------H01L21/26 | ....用波或粒子辐射轰击的 |
----------------H01L21/302 | .....改变半导体材料的表面物理特性或形状的,例如腐蚀、抛光、切割 |
------------------H01L21/314 | ......无机层 |
--------------------H01L21/316 | .......由氧化物或玻璃状氧化物或以氧化物为基础的玻璃组成的无机层 |