基本信息:
- 专利标题： Simultaneous Multi-Surface Non-Contact Optical Profiler
- 申请号：US17490630 申请日：2021-09-30
- 公开(公告)号：US20230099285A1 公开(公告)日：2023-03-30
- 发明人： Rognvald P. Garden
- 申请人： Opto-Alignment Technology, Inc.
- 申请人地址： US NC Indian Trail
- 专利权人： Opto-Alignment Technology, Inc.
- 当前专利权人： Opto-Alignment Technology, Inc.
- 当前专利权人地址： US NC Indian Trail
- 主分类号： G01M11/08
- IPC分类号： G01M11/08 ; G01B11/06 ; G01B11/24
摘要：
An optical test system and corresponding method disclosed herein provides highly accurate test data for both sides of a lens simultaneously and efficiently to analyze the surface topography and/or geometric parameters of a lens or lens system. More particularly, the optical test system and corresponding method moves the lens in test plane to align a plurality of points of a test pattern on a lens surface with a vertical axis while probes aligned with the vertical axis and on opposing sides of the lens simultaneously collect wavelength-specific data for both lens surfaces. The optical test system uses the collected wavelength-specific data to produce a surface topography and/or the associated lens geometric parameters for each lens surface.
公开/授权文献:
- US11835418B2 Simultaneous multi-surface non-contact optical profiler 公开/授权日：2023-12-05
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01M | 机器或结构部件的静或动平衡的测试；未列入其他类目的结构部件或设备的测试 |
| ------G01M11/00 | 光学设备的测试；其他类目未包括的用光学方法测试结构部件 |
| --------G01M11/08 | .机械性能的测试 |