![SAMPLE HOLDER FOR MEASUREMENTS OF OPTICALLY DETECTED MAGNETIC RESONANCE](/abs-image/US/2022/12/22/US20220404444A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: SAMPLE HOLDER FOR MEASUREMENTS OF OPTICALLY DETECTED MAGNETIC RESONANCE
- 申请号:US17765565 申请日:2020-10-02
- 公开(公告)号:US20220404444A1 公开(公告)日:2022-12-22
- 发明人: Mateusz GORYCA , Aleksander BOGUCKI
- 申请人: Uniwersytet Warszawski
- 申请人地址: PL Warszawa
- 专利权人: Uniwersytet Warszawski
- 当前专利权人: Uniwersytet Warszawski
- 当前专利权人地址: PL Warszawa
- 优先权: PLPL431387 20191004
- 国际申请: PCT/IB2020/059288 WO 20201002
- 主分类号: G01R33/32
- IPC分类号: G01R33/32 ; G01R33/30
摘要:
The invention is related to a sample holder for measurements of optically detected magnetic resonance, including a bottom plate, a top plate and a middle plate, wherein all the plates are made of a dielectric material. The top plate is provided with at least one top opening, enabling continuous optical access to the studied sample during measurements. The sample is placed in the central opening provided in the middle plate. The non-magnetic conductive strips provided on the surfaces of the bottom plate, the middle plate and the top plate ensure formation of an electrical circuit, which allows coupling of the studied sample with the generated microwave radiation to be achieved once the microwave sources is switched on. The invention also includes a sample holder for measurements of optically detected magnetic resonance, enabling formation of at least one loop of the electrical circuit.
公开/授权文献:
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R33/00 | 测量磁变量的装置或仪器 |
--------G01R33/02 | .测量磁场或磁通量的方向或大小 |
----------G01R33/24 | ..用于测量磁场或磁通量的方向或大小 |
------------G01R33/32 | ...激励或检测系统,例如用射频信号 |