基本信息:
- 专利标题： CONTEXTUALIZATION OF INDUSTRIAL DATA AT THE DEVICE LEVEL
- 申请号：US16587214 申请日：2019-09-30
- 公开(公告)号：US20210096541A1 公开(公告)日：2021-04-01
- 发明人： Bijan Sayyarrodsari , Michael Pantaleano , Ka H Lin , Juergen K Weinhofer , Andrew J Ellis , Kyle Crum , Sujeet Chand , David Vasko , Subbian Govindaraj
- 申请人： Rockwell Automation Technologies, Inc.
- 申请人地址： US OH Mayfield Heights
- 专利权人： Rockwell Automation Technologies, Inc.
- 当前专利权人： Rockwell Automation Technologies, Inc.
- 当前专利权人地址： US OH Mayfield Heights
- 主分类号： G05B19/418
- IPC分类号： G05B19/418 ; G06N20/00 ; H04W4/38 ; G06K19/077
摘要：
An industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data.
公开/授权文献:
- US11435726B2 Contextualization of industrial data at the device level 公开/授权日：2022-09-06
IPC结构图谱:
| G | 物理 |
| --G05 | 控制；调节 |
| ----G05B | 一般的控制或调节系统；这种系统的功能单元；用于这种系统或单元的监视或测试装置 |
| ------G05B19/00 | 程序控制系统 |
| --------G05B19/02 | .电的 |
| ----------G05B19/418 | ..全面工厂控制，即集中控制许多机器，例如直接或分布数字控制（DNC）、柔性制造系统（FMS）、集成制造系统（IMS）、计算机集成制造（CIM） |