发明申请
US20200371507A1 METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER
审中-公开
基本信息:
- 专利标题： METHOD AND SYSTEM FOR PERFORMING QUALITY CONTROL ON A DIAGNOSTIC ANALYZER
- 申请号：US16992310 申请日：2020-08-13
- 公开(公告)号：US20200371507A1 公开(公告)日：2020-11-26
- 发明人： Scott Lesher
- 申请人： SYSMEX CORPORATION
- 专利权人： Sysmex Corporation
- 当前专利权人： Sysmex Corporation
- 主分类号： G05B19/418
- IPC分类号： G05B19/418 ; G16H40/40 ; G01N35/00 ; G16Z99/00
摘要：
A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
公开/授权文献:
IPC结构图谱:
| G | 物理 |
| --G05 | 控制；调节 |
| ----G05B | 一般的控制或调节系统；这种系统的功能单元；用于这种系统或单元的监视或测试装置 |
| ------G05B19/00 | 程序控制系统 |
| --------G05B19/02 | .电的 |
| ----------G05B19/418 | ..全面工厂控制，即集中控制许多机器，例如直接或分布数字控制（DNC）、柔性制造系统（FMS）、集成制造系统（IMS）、计算机集成制造（CIM） |