
基本信息:
- 专利标题: MAGNETIC POSITION SENSOR SYSTEM, DEVICE, MAGNET AND METHOD
- 申请号:US16867692 申请日:2020-05-06
- 公开(公告)号:US20200370877A1 公开(公告)日:2020-11-26
- 发明人: Yves BIDAUX
- 申请人: Melexis Technologies SA
- 优先权: EP19176294.7 20190523
- 主分类号: G01B7/30
- IPC分类号: G01B7/30 ; G01B7/02 ; G01D5/14 ; G01R33/07
摘要:
A position sensor system for determining a position of a sensor device relative to a magnetic structure, the system comprising: said magnetic structure comprising a plurality of non-equidistant poles; said sensor device comprising at least three magnetic sensors spaced apart over predefined distances; and the sensor device being adapted for: a) measuring at least three in-plane magnetic field components, and for calculating two in-plane field gradients therefrom; b) measuring at least three out-of-plane magnetic field components, and for calculating two out-of-plane field gradients therefrom; c) calculating a coarse signal based on these gradients; d) calculating a fine signal based on these gradients; e) determining said position based on the coarse signal and the fine signal.
公开/授权文献:
- US11326868B2 Magnetic position sensor system, device, magnet and method 公开/授权日:2022-05-10
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01B | 长度、厚度或类似线性尺寸的计量;角度的计量;面积的计量;不规则的表面或轮廓的计量 |
------G01B7/00 | 以采用电或磁的方法为特征的计量设备 |
--------G01B7/30 | .用于计量角度或锥度;用于检测轴线准直 |