![PROBE HEATER REMAINING USEFUL LIFE DETERMINATION](/abs-image/US/2018/09/27/US20180275085A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: PROBE HEATER REMAINING USEFUL LIFE DETERMINATION
- 申请号:US15468868 申请日:2017-03-24
- 公开(公告)号:US20180275085A1 公开(公告)日:2018-09-27
- 发明人: Ben Ping-Tao Fok , Thomas Wingert
- 申请人: Rosemount Aerospace Inc.
- 主分类号: G01N27/20
- IPC分类号: G01N27/20 ; G01R31/00 ; H05B3/44 ; G01R19/32 ; G01N27/24 ; G01J5/02 ; B64D15/12 ; B64D45/00
摘要:
A probe system includes a heater and a control circuit. The heater includes a resistive heating element routed through the probe. An operational voltage is provided to the resistive heating element to provide heating for the probe. The control circuit is configured to provide a test voltage different than the operational voltage and monitor a test current generated in the resistive heating element while providing the test voltage. The control circuit is further configured to detect micro fractures in the resistive heating element based on the test current.
公开/授权文献:
- US11060992B2 Probe heater remaining useful life determination 公开/授权日:2021-07-13
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N27/00 | 用电、电化学或磁的方法测试或分析材料 |
--------G01N27/02 | .通过测试阻抗 |
----------G01N27/04 | ..通过测试电阻 |
------------G01N27/20 | ...测试缺陷的存在 |