发明申请
US20180074119A1 ELECTRONIC COMPONENT TRANSPORT APPARATUS AND ELECTRONIC COMPONENT INSPECTION APPARATUS
有权
基本信息:
- 专利标题： ELECTRONIC COMPONENT TRANSPORT APPARATUS AND ELECTRONIC COMPONENT INSPECTION APPARATUS
- 申请号：US15558771 申请日：2016-02-03
- 公开(公告)号：US20180074119A1 公开(公告)日：2018-03-15
- 发明人： Daisuke KIRIHARA , Masami MAEDA , Toshioki SHIMOJIMA , Takashi YAMAZAKI
- 申请人： Seiko Epson Corporation
- 优先权： JP2015-051772 20150316; JP2015-051778 20150316
- 国际申请： PCT/JP2016/000565 WO 20160203
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; H01L21/673
摘要：
An electronic component transport apparatus includes: an openable and closable first opening and closing portion; a first rotation support portion which supports the first opening and closing portion to be rotatable; a second opening and closing portion provided to be openable and closable in the first opening and closing portion; and a second rotation support portion which supports the second opening and closing portion to be rotatable. An area of the first opening and closing portion is greater than an area of the second opening and closing portion.
公开/授权文献:
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/28 | .电路的测试，例如用信号故障寻测器 |