![TIRE INSPECTION APPARATUS](/abs-image/US/2017/12/21/US20170363558A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: TIRE INSPECTION APPARATUS
- 申请号:US15540036 申请日:2015-12-14
- 公开(公告)号:US20170363558A1 公开(公告)日:2017-12-21
- 发明人: Troy A. Kost , Eric M. Henriksen , Christopher J. A. Ferrell
- 申请人: Bridgestone Bandag, LLC
- 国际申请: PCT/US2015/065465 WO 20151214
- 主分类号: G01N27/20
- IPC分类号: G01N27/20 ; G01M17/02
摘要:
A tire inspecting apparatus for a tire is provided. The apparatus includes a test stand for supporting and rotating a tire. The test stand is configured such that a tire supported thereon defines a center axis. The apparatus includes a testing probe configured as a high voltage electrode for generating an electric field and a grounding element. A positioning assembly includes a support bracket and a positioning arm supporting the testing probe. The positioning arm is operable to move the testing probe into a working position between the sidewalls of a tire supported on the test stand and in proximity to the grounding element. The positioning arm is connected to the support bracket for pivoting movement relative to the support bracket about a pivot axis. The pivot axis extends at a non-perpendicular angle relative to the center axis of a tire supported on the test stand.
公开/授权文献:
- US10261038B2 Tire inspection apparatus 公开/授权日:2019-04-16
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N27/00 | 用电、电化学或磁的方法测试或分析材料 |
--------G01N27/02 | .通过测试阻抗 |
----------G01N27/04 | ..通过测试电阻 |
------------G01N27/20 | ...测试缺陷的存在 |