发明申请
US20170146567A1 SYSTEMS AND METHODS FOR ELECTRICAL INSPECTION OF FLAT PANEL DISPLAYS USING CELL CONTACT PROBING PADS
审中-公开
基本信息:
- 专利标题： SYSTEMS AND METHODS FOR ELECTRICAL INSPECTION OF FLAT PANEL DISPLAYS USING CELL CONTACT PROBING PADS
- 申请号：US15359578 申请日：2016-11-22
- 公开(公告)号：US20170146567A1 公开(公告)日：2017-05-25
- 发明人： Gordon Yue , Lloyd Russell Jones , Neil Dang Nguyen , Kiran Jitendra , Kent Nguyen , Steven Aochi
- 申请人： Photon Dynamics, Inc.
- 主分类号： G01R1/067
- IPC分类号： G01R1/067 ; G09G3/00 ; G01R1/073
摘要：
A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.
公开/授权文献:
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R1/00 | 包含在G01R5/00至G01R13/00和G01R31/00组中的各类仪器或装置的零部件 |
| --------G01R1/02 | .一般结构零部件 |
| ----------G01R1/06 | ..测量引线；测量探针 |
| ------------G01R1/067 | ...测量探针 |