![TEMPERATURE TUNED FAILURE DETECTION DEVICE](/abs-image/US/2014/01/09/US20140010259A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: TEMPERATURE TUNED FAILURE DETECTION DEVICE
- 专利标题(中):温度调节故障检测装置
- 申请号:US13541711 申请日:2012-07-04
- 公开(公告)号:US20140010259A1 公开(公告)日:2014-01-09
- 发明人: JOSEPH STEVICK , QUOC TRAN PHAM , CHRISTOPHER D. PREST , JOSEPH C. POOLE , THEODORE A. WANIUK
- 申请人: JOSEPH STEVICK , QUOC TRAN PHAM , CHRISTOPHER D. PREST , JOSEPH C. POOLE , THEODORE A. WANIUK
- 主分类号: G01N3/02
- IPC分类号: G01N3/02
摘要:
The embodiments described herein relate to BMG parts and related failure detection devices. The BMG parts can be formed of a material including at least one or more amorphous alloys having binary physical properties in response to a temperature. The BMG parts can be configured in failure detection devices, which can be used for controlling and detecting failures, determining mechanical and temperature parameters, and/or providing protection and switching functions to an electronic system that contains the BMG parts and/or the failure detection devices.
摘要(中):
这里描述的实施例涉及BMG部件和相关故障检测装置。 BMG部件可以由包括响应于温度的具有二元物理性质的至少一种或多种非晶态合金的材料形成。 BMG部件可以配置在故障检测装置中,可用于控制和检测故障,确定机械和温度参数,和/或为包含BMG部件和/或故障检测的电子系统提供保护和切换功能 设备。
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N3/00 | 用机械应力测试固体材料的强度特性 |
--------G01N3/02 | .零部件 |