基本信息:
- 专利标题： SEMICONDUCTOR DEVICE AND TEST APPARATUS INCLUDING THE SAME
- 专利标题（中）：半导体器件和测试装置，包括它们
- 申请号：US13049349 申请日：2011-03-16
- 公开(公告)号：US20110227593A1 公开(公告)日：2011-09-22
- 发明人： Ki-jae SONG , Ung-jin JANG , Jun-young PARK , Sung-gu LEE , Hong-seok YEON
- 申请人： Ki-jae SONG , Ung-jin JANG , Jun-young PARK , Sung-gu LEE , Hong-seok YEON
- 优先权： KR10-2010-0023407 20100316
- 主分类号： G01R31/36
- IPC分类号： G01R31/36 ; H03L7/00
摘要：
A semiconductor device and a test apparatus including the same, the semiconductor device including a command distributor receiving a serial command that is synchronized with a first clock signal and converting the serial command into a parallel command, a command decoder receiving the parallel command and generating a pattern sequence based on the parallel command, and a signal generator receiving the pattern sequence and generating operating signals synchronized with a second clock signal, wherein a frequency of the first clock signal is less than a frequency of the second clock signal.
摘要（中）：
一种半导体器件和包括该半导体器件的测试装置，所述半导体器件包括接收与第一时钟信号同步的串行命令并将串行命令转换成并行命令的命令分配器，接收并行命令的命令解码器， 基于并行命令的模式序列，以及接收所述模式序列并生成与第二时钟信号同步的操作信号的信号发生器，其中所述第一时钟信号的频率小于所述第二时钟信号的频率。
公开/授权文献:
- US08872531B2 Semiconductor device and test apparatus including the same 公开/授权日：2014-10-28