发明申请
US20110224931A1 METHOD FOR MEASURING SCATTERING ABSORBER AND DEVICE FOR MEASURING SCATTERING ABSORBER
有权
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基本信息:
- 专利标题: METHOD FOR MEASURING SCATTERING ABSORBER AND DEVICE FOR MEASURING SCATTERING ABSORBER
- 专利标题(中):用于测量散射吸收器的方法和用于测量散射吸收器的装置
- 申请号:US13130117 申请日:2009-09-01
- 公开(公告)号:US20110224931A1 公开(公告)日:2011-09-15
- 发明人: Kenji Yoshimoto , Kazuyoshi Ohta , Daisuke Yamashita , Hiroaki Suzuki
- 申请人: Kenji Yoshimoto , Kazuyoshi Ohta , Daisuke Yamashita , Hiroaki Suzuki
- 申请人地址: JP Hamamatsu-shi, SHIZUOKA
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JP Hamamatsu-shi, SHIZUOKA
- 优先权: JP2008-299803 20081125
- 国际申请: PCT/JP2009/065239 WO 20090901
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
Acquired is the internal information of a scattering medium more accurately and easily, with the influence of an instrumental function taken into account, even where noise is contained in a measurement waveform.In a method for measuring a scattering medium, pulse light with a predetermined wavelength is made incident on a scattering medium which is a measurement object and a scattering medium for reference (S01b, S02b), the pulse light transmitted inside each of the scattering media is detected to acquire a light detection signal (S01c, S02c), the measurement waveform is acquired on the basis of the detected light detection signal (S01d, S02d), a parameter of a function showing the theoretical waveform of the measurement object is specified in such a manner that the result of convolution operation on the theoretical waveform of the measurement object and the measurement waveform of the reference is made equal to the result of convolution operation on the theoretical waveform of the reference and the measurement waveform of the measurement object (S03), and calculation is made for the internal information of the scattering medium on the basis of the theoretical waveform shown by the function (S04).
摘要(中):
即使在测量波形中包含噪声的情况下,也可以考虑到仪器功能的影响,更准确,更容易地获取散射介质的内部信息。 在用于测量散射介质的方法中,将具有预定波长的脉冲光入射到作为测量对象的散射介质和用于参考的散射介质(S01b,S02b),在每个散射介质内传输的脉冲光为 检测以获取光检测信号(S01c,S02c)时,基于检测到的光检测信号(S01d,S02d)获取测量波形,表示测量对象的理论波形的函数的参数被指定 使对测量对象的理论波形的卷积运算结果和基准的测量波形的结果等于对基准的理论波形和测量对象的测量波形的卷积运算的结果(S03) ,并根据功能所示的理论波形对散射介质的内部信息进行计算( S04)。