基本信息:
- 专利标题： Probe device having first and second probe pins
- 申请号：US12557842 申请日：2009-09-11
- 公开(公告)号：US20110062980A1 公开(公告)日：2011-03-17
- 发明人： Chun-Chieh Wu
- 申请人： Chun-Chieh Wu
- 主分类号： G01R31/02
- IPC分类号： G01R31/02 ; G01R1/067
摘要：
A probe device includes a probe body having a plurality of first holes extending through a first face thereof and a plurality of second holes aligned with the first holes and extending through an opposite second face thereof, a plurality of spaced-apart first probe pins inserted fittingly and removably into respective first holes and each including a first contact portion extending out of the first face, and a first connecting portion extending into the respective first hole, and a plurality of spaced-apart second probe pins inserted fittingly and removably into respective second holes and each including a second contact portion extending out of the second face, and a second connecting portion extending into the respective second hole and having an insert space. The first connecting portion is inserted fittingly and removably into the insert space, and mates with the second connecting portion.
公开/授权文献:
- US08085057B2 Probe device having first and second probe pins 公开/授权日：2011-12-27
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/02 | .对电设备、线路或元件进行短路、断路、泄漏或不正确连接的测试 |