![Methods and system for aligning optical packages](/abs-image/US/2009/07/30/US20090190131A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: Methods and system for aligning optical packages
- 专利标题(中):光学封装对准方法和系统
- 申请号:US12072386 申请日:2008-02-26
- 公开(公告)号:US20090190131A1 公开(公告)日:2009-07-30
- 发明人: Jacques Gollier , Garrett Andrew Piech , Daniel Ohen Ricketts
- 申请人: Jacques Gollier , Garrett Andrew Piech , Daniel Ohen Ricketts
- 主分类号: G01B11/00
- IPC分类号: G01B11/00
摘要:
A method for aligning a beam spot with a waveguide portion of a wavelength conversion device includes scanning a beam spot over the input face of the wavelength conversion device while measuring the output intensity of the device such that an output intensity for each of a plurality of fast scan lines is generated. A first alignment set point is then determined based on the output intensity of each fast scan line. A second scan of the beam spot is then performed over the fast scan line containing the first alignment set point while measuring the output intensity for each point along the fast scan line. A second alignment set point is then determined based on the output intensities measured during the second scan. The beam spot is then aligned with the waveguide portion using the first alignment set point and the second alignment set point.
摘要(中):
将波束点与波长转换器件的波导部分对准的方法包括在测量器件的输出强度的同时,在波长转换器件的输入面上扫描波束点,使得多个快速 生成扫描线。 然后基于每条快速扫描线的输出强度确定第一对准设定点。 然后在包含第一对准设定点的快速扫描线上执行束斑的第二次扫描,同时测量沿着快速扫描线的每个点的输出强度。 然后基于在第二次扫描期间测量的输出强度来确定第二对准设定点。 然后使用第一对准设定点和第二对准设定点将束斑与波导部分对准。
公开/授权文献:
- US07751045B2 Methods and system for aligning optical packages 公开/授权日:2010-07-06
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01B | 长度、厚度或类似线性尺寸的计量;角度的计量;面积的计量;不规则的表面或轮廓的计量 |
------G01B11/00 | 以采用光学方法为特征的计量设备 |