
基本信息:
- 专利标题: Polishing apparatus and substrate processing apparatus
- 专利标题(中):抛光装置和基板处理装置
- 申请号:US10581669 申请日:2005-02-23
- 公开(公告)号:US20090117828A1 公开(公告)日:2009-05-07
- 发明人: Akihisa Hongo , Kenya Ito , Kenji Yamaguchi , Masayuki Nakanishi
- 申请人: Akihisa Hongo , Kenya Ito , Kenji Yamaguchi , Masayuki Nakanishi
- 优先权: JP2004-049236 20040225
- 国际申请: PCT/JP05/03415 WO 20050223
- 主分类号: B24B49/04
- IPC分类号: B24B49/04 ; B24B1/04 ; B24B49/12 ; B24B9/02 ; B24B57/02
摘要:
The present invention relates to a polishing apparatus for removing surface roughness produced at a peripheral portion of a substrate, or for removing a film formed on a peripheral portion of a substrate. The polishing apparatus includes a housing (3) for forming a polishing chamber (2) therein, a rotational table (1) for holding and rotating a substrate (W), a polishing tape supply mechanism (6) for supplying a polishing tape (5) into the polishing chamber (2) and supplied to the polishing chamber (2), a polishing head (35) for pressing the polishing tape (5) against a bevel portion of the substrate (W), a liquid supply (50) for supplying a liquid to a front surface and a rear surface of the substrate (W), and a regulation mechanism (16) for making an internal pressure of the polishing chamber (2) being set to be lower than an external pressure of the polishing chamber (2).
摘要(中):
本发明涉及一种用于去除在基板的周边部分产生的表面粗糙度或用于去除形成在基板的周边部分上的膜的抛光装置。 抛光装置包括用于在其中形成研磨室(2)的壳体(3),用于保持和旋转基底(W)的旋转台(1),用于供应研磨带(5)的研磨带供给机构 )到抛光室(2)中并供给到抛光室(2),用于将抛光带(5)压靠在基板(W)的斜面部分上的抛光头(35) 将液体供给到所述基板(W)的前表面和后表面;以及调节机构(16),用于使所述研磨室(2)的内部压力被设定为低于所述研磨室 (2)。
公开/授权文献:
- US07682225B2 Polishing apparatus and substrate processing apparatus 公开/授权日:2010-03-23