![SEMICONDUCTOR DEVICE](/abs-image/US/2008/07/10/US20080164969A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: SEMICONDUCTOR DEVICE
- 专利标题(中):半导体器件
- 申请号:US11958360 申请日:2007-12-17
- 公开(公告)号:US20080164969A1 公开(公告)日:2008-07-10
- 发明人: Kazushi Kono , Takeshi Iwamoto , Hisayuki Kato , Shigeki Obayashi , Toshiaki Yonezu
- 申请人: Kazushi Kono , Takeshi Iwamoto , Hisayuki Kato , Shigeki Obayashi , Toshiaki Yonezu
- 优先权: JP2007-002685 20070110
- 主分类号: H01H37/76
- IPC分类号: H01H37/76
摘要:
The semiconductor device which has an electric straight line-like fuse with a small occupying area is offered.A plurality of projecting portions 10f are formed in the position shifted from the middle position of electric fuse part 10a, and, more concretely, are formed in the position distant from via 10e and near via 10d. A plurality of projecting portions 20f are formed in the position shifted from the middle position of electric fuse part 20a, and, more concretely, are formed in the position distant from via 20d and near 20e. That is, projecting portions 10f and projecting portions 20f are arranged in the shape of zigzag.
摘要(中):
提供具有小占用面积的电直线状熔断器的半导体器件。 多个突出部分10f形成在从电熔丝部分10a的中间位置偏移的位置,更具体地,形成在远离通孔10e和靠近通孔10d的位置。 多个突出部分20f形成在从电熔丝部分20a的中间位置移位的位置,更具体地,形成在远离通孔20d和靠近20e的位置。 也就是说,突出部分10f和突出部分20f被布置成Z字形。
公开/授权文献:
- US07808076B2 Semiconductor device 公开/授权日:2010-10-05
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01H | 电开关;继电器;选择器;紧急保护装置 |
------H01H37/00 | 热动开关 |
--------H01H37/74 | .热或冷只能引起触点开启或者只能引起触点闭合的开关 |
----------H01H37/76 | ..由熔断材料的熔化、易燃材料的燃烧或易爆材料的爆炸引起触点部件动作的 |