基本信息:
- 专利标题： Polarization Based Interferometric Detector
- 专利标题（中）：基于偏振的干涉检测器
- 申请号：US11735900 申请日：2007-04-16
- 公开(公告)号：US20080002202A1 公开(公告)日：2008-01-03
- 发明人： John Hall , Viatcheslav Petropavlovskikh , Oyvind Nilsen
- 申请人： John Hall , Viatcheslav Petropavlovskikh , Oyvind Nilsen
- 主分类号： G01J4/00
- IPC分类号： G01J4/00
摘要：
A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.
摘要（中）：
公开了一种用于确定样品材料的光学性质的传感器和方法。 传感器包括产生相对于入射平面具有预定极化取向的线偏振光束的光源。 线偏振光束被从样品反射并被分裂成第二和第三光束，其中第二和第三光束由第一光束的相互正交分量的组合投影组成。 信号处理器测量第二和第三光束之间的强度差，以计算由样品材料引起的相位差。
公开/授权文献:
- US08488120B2 Polarization based interferometric detector 公开/授权日：2013-07-16