基本信息:
- 专利标题: 元件處理器
- 专利标题(英):Device handler
- 专利标题(中):组件处理器
- 申请号:TW106119875 申请日:2017-06-14
- 公开(公告)号:TW201743050A 公开(公告)日:2017-12-16
- 发明人: 柳弘俊 , YOO, HONG-JUN
- 申请人: 宰體有限公司 , JT CORPORATION
- 专利权人: 宰體有限公司,JT CORPORATION
- 当前专利权人: 宰體有限公司,JT CORPORATION
- 代理人: 侯德銘
- 优先权: 10-2016-0073780 20160614
- 主分类号: G01N21/95
- IPC分类号: G01N21/95 ; H01L21/67
Disclosed is an element handler comprising: loading units (100) in each of which a tray (2), having a plurality of elements (1) therein, is loaded and which linearly moves the tray; a first bottom surface vision inspection unit, installed on one side of the loading unit (100), perpendicular to the direction of transport of the tray (2) therein, for carrying out a vision inspection of the elements (1); a first guide rail (680) arranged vertically with respect to the direction of movement of the tray (2) in the loading unit (100); a first transport tool (610), coupled to the first guide rail (680) so as to move along therewith, for picking up and transporting an element from the loading unit (100) to the first bottom surface vision inspection unit in order to carry out the vision inspection; a second guide rail (690) arranged in parallel with the first guide rail (680); a second bottom surface vision inspection unit, installed on one side of the loading unit (100), perpendicular to the direction of transport of the tray (2) in the loading unit (100), for carrying out vision inspection of the elements (1); a second transport tool (630), coupled to the second guide rail (690) so as to move along therewith, for picking up and transporting an element from the loading unit (100) to the second bottom surface vision inspection unit in order to carry out the vision inspection; and unloading units (310, 320 and 330) for receiving the trays (2) containing the elements (1) that have been vision inspected in the loading unit (100) and grouping the elements (1) in the corresponding tray (2) in accordance with the results of the vision inspection.
公开/授权文献:
- TWI668437B 元件處理器 公开/授权日:2019-08-11
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
------------G01N21/95 | ...特征在于待测物品的材料或形状 |