基本信息:
- 专利标题： 위상 절연체를 이용한 표면 플라즈몬 및 편광 검출소자와 그 제조방법 및 표면 플라즈몬과 편광 검출방법
- 专利标题（英）：Device of detecting surface plasmon and polarization using topological insulator and method of manufacturing the same and method of detecting surface plasmon and polarization
- 申请号：KR20130140894 申请日：2013-11-19
- 公开(公告)号：KR102176582B1 公开(公告)日：2020-11-09
- 发明人： 정희정 , 이장원 , 천상모
- 申请人： 삼성전자주식회사
- 申请人地址： , Samsung-ro, Yeongtong-gu...
- 专利权人： 삼성전자주식회사
- 当前专利权人： 삼성전자주식회사
- 当前专利权人地址： , Samsung-ro, Yeongtong-gu...
- 代理人： 리앤목특허법인
- 优先权： KR20130140894 2013-11-19
- 主分类号： G01N21/55
- IPC分类号： G01N21/55 ; G01N21/21
According to an embodiment of the present invention, disclosed are surface plasmon using a topological insulator and a polarization detection device and a manufacturing method thereof. According to an embodiment, the surface plasmon and the polarization detection device comprise: a topological insulation layer mounted on a substrate; a first and a second electrode mounted on the topological insulation layer; and a waveguide connected to the topological insulation layer between the first and the second electrode. The topological insulation layer which is a channel layer may be a Bi2Se3 layer or a Bi2Te3 layer, but is not limited to the materials. The waveguide may be surface plasma polariton (SPP) waveguide. The waveguide may include a plurality of waveguides which are spaced.COPYRIGHT KIPO 2015
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |
| --------G01N21/01 | .便于进行光学测试的装置或仪器 |
| ----------G01N21/55 | ..镜面反射率 |