基本信息:
- 专利标题: 이온 빔 에칭을 위한 이온 주입기 전극 어셈블리
- 专利标题(英):Ion injector and lens system for ion beam milling
- 专利标题(中):离子注射器和镜头系统用于离子束铣削
- 申请号:KR1020150121480 申请日:2015-08-28
- 公开(公告)号:KR1020160026770A 公开(公告)日:2016-03-09
- 发明人: 베리3세이반엘. , 릴토르스텐
- 申请人: 램 리써치 코포레이션
- 申请人地址: 미국 ***** 캘리포니아주 프레몬트 쿠싱 파크웨이 ****
- 专利权人: 램 리써치 코포레이션
- 当前专利权人: 램 리써치 코포레이션
- 当前专利权人地址: 미국 ***** 캘리포니아주 프레몬트 쿠싱 파크웨이 ****
- 代理人: 특허법인인벤투스
- 优先权: US14/473,863 2014-08-29
- 主分类号: H01L21/3065
- IPC分类号: H01L21/3065 ; H01L21/3213 ; H01L21/311 ; H01L21/265
Embodiments of the present disclosure are directed to methods and apparatus, as well as a method for forming such a device for carrying out ion etching on the semiconductor substrate. In some embodiments, the electrode assembly may be manufactured, the electrode assembly comprises a plurality of electrodes with different purposes, and each of the electrode in a stable manner is mechanically fixed to the next electrode. After the electrodes are secured together may be apertures are formed in the electrodes respectively, to thereby ensure that the fine alignment between the electrodes that are neighboring apertures. In some cases, the electrodes are formed from doped silicon degenerate (縮 退), the electrode assembly is held together by electrostatic bonding. Other electrode material and fixing methods may also be used. The electrode assembly may comprise, hollow cathode emitter electrodes in a truncated conical shape or other non-cylindrical aperture may have an aperture shape in some cases. The chamber liner and / or a reflector can also be present in some cases.
信息查询:
EspacenetIPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
--------H01L21/02 | .半导体器件或其部件的制造或处理 |
----------H01L21/027 | ..未在H01L21/18或H01L21/34组中包含的为进一步的光刻工艺在半导体之上制作掩膜 |
------------H01L21/18 | ...器件有由周期表第Ⅳ族元素或含有/不含有杂质的AⅢBⅤ族化合物构成的半导体,如掺杂材料 |
--------------H01L21/26 | ....用波或粒子辐射轰击的 |
----------------H01L21/302 | .....改变半导体材料的表面物理特性或形状的,例如腐蚀、抛光、切割 |
------------------H01L21/306 | ......化学或电处理,例如电解腐蚀 |
--------------------H01L21/3065 | .......等离子腐蚀;活性离子腐蚀 |