基本信息:
- 专利标题： 고처리량 현미경 장치
- 专利标题（英）：High throughput microscopy device
- 专利标题（中）：高速显微镜装置
- 申请号：KR1020157001420 申请日：2013-06-27
- 公开(公告)号：KR1020150036125A 公开(公告)日：2015-04-07
- 发明人： 반덴브라버,렌스 , 반덴둘,튜니스코르넬리스 , 사데이안마르나니,하메드 , 린벨드,닉
- 申请人： 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오
- 申请人地址： Anna van Buerenplein *, NL-**** DA 's-Gravenhage, The Netherlands
- 专利权人： 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오
- 当前专利权人： 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오
- 当前专利权人地址： Anna van Buerenplein *, NL-**** DA ＇s-Gravenhage, The Netherlands
- 代理人： 특허법인 무한
- 优先权： EP121742043 2012-06-28; EP121754451 2012-07-06
- 国际申请： PCT/NL2013/050459 2013-06-27
- 国际公布： WO2014003557 2014-01-03
- 主分类号： G01Q10/06
- IPC分类号： G01Q10/06 ; G01Q70/06
The object is mounted on the surface of the sample carrier. Surface characteristics of the object are measured and / or changed by the respective movable head in a plurality of independent, including a microscope probe. The head are located between the surface and the surface of the sample carrier of the reference grid plate. Head specific target points are selected for the head. Each head is moved to the target point of the head on the surface of the reference grid plate. Position of the head during the movement is determined from the marking on the reference grid plate sensed by the sensor within the head. When the head is that the target points are selected for the sensor head indicate that seating the head on the reference grid plate and / or the head and a force between the reference grid plate to clamp switches.
公开/授权文献:
- KR102059320B1 고처리량 현미경 장치 公开/授权日：2019-12-26