基本信息:
- 专利标题： LED들 및 전원의 컨디션을 평가하기 위한 기법들
- 专利标题（英）：Techniques for assessing condition of leds and power supply
- 专利标题（中）：用于评估LED和电源条件的技术
- 申请号：KR1020147023282 申请日：2013-01-21
- 公开(公告)号：KR1020140114889A 公开(公告)日：2014-09-29
- 发明人： 지쓰에거,베른하르트 , 코스트런,마리잔
- 申请人： 오스람 실바니아 인코포레이티드
- 申请人地址： *** Ballardvale St., Wilmington, MA ***** U.S.A.
- 专利权人： 오스람 실바니아 인코포레이티드
- 当前专利权人： 오스람 실바니아 인코포레이티드
- 当前专利权人地址： *** Ballardvale St., Wilmington, MA ***** U.S.A.
- 代理人： 특허법인 남앤드남
- 优先权： US61/588,838 2012-01-20
- 国际申请： PCT/US2013/022382 2013-01-21
- 国际公布： WO2013110027 2013-07-25
- 主分类号： H05B33/08
- IPC分类号： H05B33/08
Techniques are described for evaluating the condition of the power supply of the LED and the solid state lighting system. Techniques include, for example, a switch - in order to measure the capacitance of the output capacitor (C) in the power mode (SMPS), and may be used to measure the condition of the LED to be driven by such power. In some cases, this assessment can be carried out in a light controller for controlling a lighting system that may be configured to determine the condition of C and the LED at the same time. In one example case, the method may include, for example, a micro operating a lighting system may be performed by the controller. An illumination system for practicing the technique, and can be periodically evaluated by the ability to provide real-time diagnostics. Many exemplary embodiments of the SMPS LED lighting systems will be apparent in consideration of the present application.
公开/授权文献:
- KR101809193B1 LED들 및 전원의 컨디션을 평가하기 위한 기법들 公开/授权日：2017-12-14
信息查询:
EspacenetIPC结构图谱:
| H | 电学 |
| --H05 | 其他类目不包含的电技术 |
| ----H05B | 电热；其他类目不包含的电照明 |
| ------H05B33/00 | 电致发光光源 |
| --------H05B33/02 | .零部件 |
| ----------H05B33/08 | ..并非适用于一种特殊应用的电路装置 |