基本信息:
- 专利标题： 분광 특성 측정 장치 및 분광 특성 측정 방법
- 专利标题（英）：Spectral characteristics measurement device and method for measuring spectral characteristics
- 专利标题（中）：光谱特性测量装置和测量光谱特性的方法
- 申请号：KR1020147023627 申请日：2013-02-27
- 公开(公告)号：KR1020140114447A 公开(公告)日：2014-09-26
- 发明人： 이시마루이치로
- 申请人： 고쿠리츠다이가쿠호우징 카가와다이가쿠
- 申请人地址： *-*, Saiwai-cho, Takamatsu-shi, Kagawa ***-**** JAPAN
- 专利权人： 고쿠리츠다이가쿠호우징 카가와다이가쿠
- 当前专利权人： 고쿠리츠다이가쿠호우징 카가와다이가쿠
- 当前专利权人地址： *-*, Saiwai-cho, Takamatsu-shi, Kagawa ***-**** JAPAN
- 代理人： 특허법인태평양
- 优先权： JPJP-P-2012-044272 2012-02-29
- 国际申请： PCT/JP2013/055228 2013-02-27
- 国际公布： WO2013129519 2013-09-06
- 主分类号： G01N21/359
- IPC分类号： G01N21/359 ; A61B5/145 ; A61B5/1455 ; A61B5/00 ; G01B9/02 ; G01N21/25 ; G01N21/45 ; G01N21/49
The present invention was incident to the measured fixing the mirror portion and the movable mirror unit the light emitted from the measuring object to form the said fixed reflected by the measurement light and the movable mirror unit of measurement light reflected by the mirror section interference light. At this time, by moving the movable parts of the mirror obtain interference light of measurement light intensity change, on the basis of the change determined by the grams of measurement light interferometer. In addition, at the same time, the reference light of the wavelength that is part of a narrow band of the measurement light wavelength band, the fixed mirror section and the by incident on the movable mirror portion, the fixed mirror section the reflected reference beam by a and that the movable reflected by the mirror portion reference light to form the interference light. At this time, the movable parts of the mirror movement by the basis of the amplitude, and the measurement light and the phase difference between the reference light of the wavelength as the reference light of the measurement light of the interference light intensity changes of the reference beam, and correcting the program in the measurement light interface, the corrected based on the gram to interface to obtain the measurement light spectrum.
公开/授权文献:
- KR101627444B1 분광 특성 측정 장치 및 분광 특성 측정 방법 公开/授权日：2016-06-03
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |
| --------G01N21/01 | .便于进行光学测试的装置或仪器 |
| ----------G01N21/21 | ..影响偏振的性质 |
| ------------G01N21/31 | ...测试材料在特定元素或分子的特征波长下的相对效应，例如原子吸收光谱术 |
| --------------G01N21/35 | ....利用红外光 |
| ----------------G01N21/359 | .....利用近红外光 |