基本信息:
- 专利标题: 광학 측정 센서
- 专利标题(英):Optical measuring sensor
- 专利标题(中):光学测量传感器
- 申请号:KR1020147017597 申请日:2012-11-29
- 公开(公告)号:KR1020140094651A 公开(公告)日:2014-07-30
- 发明人: 델리와라쉬레니크
- 申请人: 아나로그 디바이시즈 인코포레이티드
- 申请人地址: One Technology Way, Norwood, MA *****, U.S.A.
- 专利权人: 아나로그 디바이시즈 인코포레이티드
- 当前专利权人: 아나로그 디바이시즈 인코포레이티드
- 当前专利权人地址: One Technology Way, Norwood, MA *****, U.S.A.
- 代理人: 김태홍
- 优先权: US13/329,510 2011-12-19
- 国际申请: PCT/US2012/066969 2012-11-29
- 国际公布: WO2013095882 2013-06-27
- 主分类号: G01B11/26
- IPC分类号: G01B11/26 ; G01B11/14 ; G01J1/42 ; G01M11/00
The optical detector may comprise measuring jangchieul for quantifying the light which is detected in the light detector after passing through the aperture without the need of, and lens aperture, at least two photodetectors. Aperture may be located between the light becomes the light source and two photodetectors to pass into a light detector through the aperture from the light source. According to the photo-detector are PIN junction photodiode can comprise, being electrically isolated from each other, a side-by-side configuration and positioned next to each other, following the light angle of the change from the light source incident on the aperture to be detected in the light detector It can be aligned with the aperture to vary the ratio of light quantified. Optical detectors and methods are provided.
公开/授权文献:
- KR101660606B1 광학 측정 센서 公开/授权日:2016-09-27
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01B | 长度、厚度或类似线性尺寸的计量;角度的计量;面积的计量;不规则的表面或轮廓的计量 |
------G01B11/00 | 以采用光学方法为特征的计量设备 |
--------G01B11/26 | .用于计量角度或锥度;用于检测轴线准直 |