基本信息:
- 专利标题： 고속 입력-출력 디바이스들의 테스트
- 专利标题（英）：Testing high-speed input-output devices
- 专利标题（中）：测试高速输入输出设备
- 申请号：KR1020137011472 申请日：2011-10-05
- 公开(公告)号：KR1020130132426A 公开(公告)日：2013-12-04
- 发明人： 설진송 , 김민규 , 응우옌손
- 申请人： 래티스세미컨덕터코퍼레이션
- 申请人地址： *** SW Fifth Avenue, Suite ***, Portland, Oregon *****, U.S.A.
- 专利权人： 래티스세미컨덕터코퍼레이션
- 当前专利权人： 래티스세미컨덕터코퍼레이션
- 当前专利权人地址： *** SW Fifth Avenue, Suite ***, Portland, Oregon *****, U.S.A.
- 代理人： 특허법인에이아이피
- 优先权： US12/898,528 2010-10-05
- 国际申请： PCT/US2011/054990 2011-10-05
- 国际公布： WO2012048049 2012-04-12
- 主分类号： G01R31/319
- IPC分类号： G01R31/319 ; G01R31/317 ; G01R31/26
Embodiment of the present invention are generally high-speed input-output teaches the testing of the device. High-speed input-one embodiment of the output apparatus forms a transmitter and a receiver, and to the output of the transmitter includes a loop-back connection to the receiver input, the loop-back connection portion includes a first connector and a second connector for the transmission of differential signals. Device includes a first terminal, and further comprising: a second inductor having a first inductor and a first terminal and a second terminal having a second terminal, the first terminal of the first inductor is connected to the first connector of the second inductor a first terminal is connected to the second connector, the second terminal of the second terminal and the second inductor of the first inductor provides a test access port for direct current testing of the device.
公开/授权文献:
- KR101762768B1 고속 입력-출력 디바이스들의 테스트 公开/授权日：2017-07-28
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/02 | .对电设备、线路或元件进行短路、断路、泄漏或不正确连接的测试 |
| ----------G01R31/317 | ..数字电路的测试 |
| ------------G01R31/3181 | ...性能测试 |
| --------------G01R31/319 | ....测试器硬件，即输出处理电路 |