基本信息:
- 专利标题: 손실 프로파일 분석
- 专利标题(英):Loss profile analysis
- 专利标题(中):损失概况分析
- 申请号:KR1020127031090 申请日:2011-05-03
- 公开(公告)号:KR1020130113313A 公开(公告)日:2013-10-15
- 发明人: 에인지거,핀차스 , 벤-쉬무엘,에란 , 빌친스키,알렉산더 , 라펠,아밋
- 申请人: 고지 엘티디.
- 申请人地址: Mintflower Place, *th Floor * Par-La-Ville Road Hamilton, HM**, Bermuda
- 专利权人: 고지 엘티디.
- 当前专利权人: 고지 엘티디.
- 当前专利权人地址: Mintflower Place, *th Floor * Par-La-Ville Road Hamilton, HM**, Bermuda
- 代理人: 허용록
- 优先权: US61/282,980 2010-05-03; US61/282,981 2010-05-03; US61/282,983 2010-05-03; US61/282,984 2010-05-03; US61/282,985 2010-05-03; US61/282,986 2010-05-03
- 国际申请: PCT/IB2011/001489 2011-05-03
- 国际公布: WO2011138688 2011-11-10
- 主分类号: H05B6/64
- IPC分类号: H05B6/64
An apparatus and method for applying an electromagnetic energy applied to the target energy is disclosed in the section. It is at least one of the processor that electromagnetic energy to the target zone in the energy applied can be configured to be applied in a number of the electromagnetic field pattern. The processor may be further configured to determine the amount of power dissipated from the energy applying section for each of a plurality of field patterns. The processor may be further configured to determine the spatial distribution of the energy-absorbing properties for at least a portion of the energy is based on an amount of power to be destroyed when applied to a plurality of field patterns applied energy zone area.
信息查询:
EspacenetIPC结构图谱:
H | 电学 |
--H05 | 其他类目不包含的电技术 |
----H05B | 电热;其他类目不包含的电照明 |
------H05B6/00 | 通过电场、磁场或电磁场加热的 |
--------H05B6/64 | .微波加热 |