基本信息:
- 专利标题： 펄스 와전류를 이용한 도체두께 탐상장치
- 专利标题（英）：Apparatus for detecting thickness of the conductor using differential pulsed eddy current probe
- 专利标题（中）：用差分脉冲EDDY电流探测器检测导体厚度的装置
- 申请号：KR1020100035252 申请日：2010-04-16
- 公开(公告)号：KR1020110115749A 公开(公告)日：2011-10-24
- 发明人： 박덕근 , 정용무 , 김흥회
- 申请人： 한국원자력연구원 , 한국수력원자력 주식회사
- 申请人地址： 대전광역시 유성구 대덕대로***번길 ***(덕진동)
- 专利权人： 한국원자력연구원,한국수력원자력 주식회사
- 当前专利权人： 한국원자력연구원,한국수력원자력 주식회사
- 当前专利权人地址： 대전광역시 유성구 대덕대로***번길 ***(덕진동)
- 代理人： 이원희
- 主分类号： G01N27/90
- IPC分类号： G01N27/90 ; G01B7/06
Conductor thickness inspection apparatus using a pulsed eddy current in accordance with the present invention evaluate the loss in the conductor on the outside of the conductor as a non-destructive testing, using a differential probe (probe) for a pulse eddy current induced by applying broadband pulsed voltage to the driving coil configured to, specifically, a probe unit having a differential Hall sensor comprising a drive coil and into two; Is connected to the probe unit a pulse generating unit that generates a broadband pulse voltage to the drive coil; A differential amplifier unit which is connected to the probe amplifier unit for the measured signal induced in the Hall sensor; A / D conversion unit is connected to the amplifier for converting the measurement signal into a digital signal; And the probe portion, and a pulse generation section, an amplification section, and the A / D conversion control unit, the control unit is configured to store and display the digital signal, is configured to include a.
公开/授权文献:
- KR101158411B1 펄스 와전류를 이용한 도체두께 탐상장치 公开/授权日：2012-06-22
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N27/00 | 用电、电化学或磁的方法测试或分析材料 |
| --------G01N27/02 | .通过测试阻抗 |
| ----------G01N27/82 | ..用于测试缺陷的存在 |
| ------------G01N27/90 | ...利用涡流 |