基本信息:
- 专利标题： 인쇄 회로 기판을 테스트하는 방법
- 专利标题（英）：Method for testing printed circuit boards
- 专利标题（中）：测试打印电路板的方法
- 申请号：KR1020117018558 申请日：2010-01-13
- 公开(公告)号：KR1020110112836A 公开(公告)日：2011-10-13
- 发明人： 로마노브,빅터 , 볼페르트길버트 , 파울하버마틴
- 申请人： 에이에스엠 어셈블리 시스템스 스위처랜드 게엠베하
- 申请人地址： Hardturmstrasse ***, CH **** Zurich, Switzerland
- 专利权人： 에이에스엠 어셈블리 시스템스 스위처랜드 게엠베하
- 当前专利权人： 에이에스엠 어셈블리 시스템스 스위처랜드 게엠베하
- 当前专利权人地址： Hardturmstrasse ***, CH **** Zurich, Switzerland
- 代理人： 김성호
- 优先权： DE10 2009 004 5554 2009-01-14
- 国际申请： PCT/EP2010/050361 2010-01-13
- 国际公布： WO2010081834 2010-07-22
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R1/073
The present invention, have a set-up for testing for contacting a circuit board test points of the test circuit board, to a method of testing a circuit board using the test device. Test setup for is, have the test contact element for a given regular grid. The method comprising, a) Test set-up for this is pressed tight to the circuit board to be tested in a first test location for the circuit board test, in contact with several circuit board test point at least one contact element for the test by that in the step, b) is the continuity test on several conductor paths are set-up for testing step, c) measuring with respect to breakage and / or short-circuit by the turned by moving placed on different test position with respect to the circuit board for testing, this position, previously to fracture and / or short-circuit at least one circuit board test point of a conductor path that was not fully measure at least one of the test with respect to private use step and contact with the contact element, d) Yet another conductive path is broken by the continuity measurement and / or step which is to be measured with respect to short-circuit, and e) step c) until the test at least a majority of the conductive paths of the circuit board to measure and d) the step is repeated. Here, the test set-up is used for the test has a contact element for placement at a density of at least 100 contact points per square centimeter.
公开/授权文献:
- KR101337911B1 인쇄 회로 기판을 테스트하는 방법 公开/授权日：2013-12-09
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/28 | .电路的测试，例如用信号故障寻测器 |