基本信息:
- 专利标题： 노면 프로파일 측정 시스템, 및 방법
- 专利标题（英）：Method and system for measuring road surface profile
- 专利标题（中）：用于测量道路表面轮廓的方法和系统
- 申请号：KR1020100022716 申请日：2010-03-15
- 公开(公告)号：KR1020110103583A 公开(公告)日：2011-09-21
- 发明人： 문형철 , 김장락 , 김종호 , 이형돈
- 申请人： 주식회사 로드텍
- 申请人地址： (Sa-dong, Gyeonggi Techno Park RIT Center) ***, ***, *** Ho, ***, Haean-ro, Ansan-si sangnok-gu, Gyeonggi-do, (***-***), Republic of Korea
- 专利权人： 주식회사 로드텍
- 当前专利权人： 주식회사 로드텍
- 当前专利权人地址： (Sa-dong, Gyeonggi Techno Park RIT Center) ***, ***, *** Ho, ***, Haean-ro, Ansan-si sangnok-gu, Gyeonggi-do, (***-***), Republic of Korea
- 代理人： 특허법인주원
- 主分类号： G01B11/24
- IPC分类号： G01B11/24 ; G01B11/30
The road surface profile measuring system, and method are disclosed. Road surface profile measurement system comprises a display line, the line-up part, and the profile information is created. Line display portion displays the lines on the road surface in the direction of measurement previously set, the line-up unit, and recording the displayed line above at a position on the angle spaced by an angle previously set in the vertical upward direction of the marked line, the profile information generating section taken images It generates a profile from the information of the road surface. The information road surface profile measuring the height of the road surface and not to obtain through the calculation processing, it is possible display a line on a road surface and to obtain an accurate profile of the road surface that is not distorted due to obtain directly by taking the indicated line.
公开/授权文献:
- KR101203617B1 노면 프로파일 측정 시스템, 및 방법 公开/授权日：2012-11-21
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01B | 长度、厚度或类似线性尺寸的计量；角度的计量；面积的计量；不规则的表面或轮廓的计量 |
| ------G01B11/00 | 以采用光学方法为特征的计量设备 |
| --------G01B11/24 | .用于计量轮廓或曲率 |