基本信息:
- 专利标题： ＬＥＤ 칩의 광특성 평가방법 및 이를 활용한 ＬＥＤ 장치의 제조 방법
- 专利标题（英）：Apparatus and method for evaluating optical properties of led chip and method of manufacturing led device using the same
- 专利标题（中）：用于评估LED芯片的光学特性的装置和方法以及使用该芯片制造LED装置的方法
- 申请号：KR1020100010927 申请日：2010-02-05
- 公开(公告)号：KR1020110091210A 公开(公告)日：2011-08-11
- 发明人： 박일우 , 손종락
- 申请人： 삼성전자주식회사
- 申请人地址： ***, Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, Republic of Korea
- 专利权人： 삼성전자주식회사
- 当前专利权人： 삼성전자주식회사
- 当前专利权人地址： ***, Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, Republic of Korea
- 代理人： 특허법인씨엔에스
- 主分类号： G01J3/50
- IPC分类号： G01J3/50 ; G01J3/443 ; G01J3/51 ; H01L33/58
摘要：
PURPOSE: Device and method for evaluating optical characteristic of an LED chip and a method of manufacturing an LED device are provided to reduce color dispersion of an LED device emitting a particular color of light including white and increase manufacturing yield of an LED device emitting a particular color of light. CONSTITUTION: A device(100) for evaluating optical characteristic of an LED chip comprises light converting filters(151,152), which convert monochromatic light emitting from an LED chip(50), for example blue light or ultraviolet light, into other wavelength of color and emits white light. White light emitting from the light converting filters is received by a unit for measuring optical characteristic, thus the optical characteristic of the white light is measured. The optical characteristic measuring unit can comprises a photodiode sensor(130) measuring luminous energy and a spectrometer(140) measuring spectrum.
摘要（中）：
目的：提供用于评估LED芯片的光学特性的装置和方法以及制造LED装置的方法，以减少发射包括白色的特定颜色的LED的LED装置的色散，并且增加发射特定的LED的LED装置的制造成品率 光的颜色 构成：用于评估LED芯片的光学特性的设备（100）包括光转换滤光器（151,152），其将从LED芯片（50）发射的单色光（例如蓝光或紫外光）转换成其他波长的颜色， 发出白光。 由光转换滤波器发出的白光由用于测量光学特性的单元接收，因此测量白光的光学特性。 光学特性测量单元可以包括测量光能的光电二极管传感器（130）和测量光谱的光谱仪（140）。
公开/授权文献:
- KR101680851B1 ＬＥＤ 칩의 광특성 평가방법 및 이를 활용한 ＬＥＤ 장치의 제조 방법 公开/授权日：2016-11-30