基本信息:
- 专利标题： 반도체 센서를 이용한 방사선 계측 시스템 및 계측 방법
- 专利标题（英）：Radiation detection system and method with semiconductor detector
- 专利标题（中）：具有半导体检测器的辐射检测系统和方法
- 申请号：KR1020130027686 申请日：2013-03-15
- 公开(公告)号：KR101478737B1 公开(公告)日：2015-01-05
- 发明人： 정만희 , 하장호 , 김한수 , 김영수
- 申请人： 한국원자력연구원
- 申请人地址： 대전광역시 유성구 대덕대로***번길 ***(덕진동)
- 专利权人： 한국원자력연구원
- 当前专利权人： 한국원자력연구원
- 当前专利权人地址： 대전광역시 유성구 대덕대로***번길 ***(덕진동)
- 代理人： 특허법인 웰
- 主分类号： H01L27/14
- IPC分类号： H01L27/14 ; G01T1/24
It relates to a radiation measurement system and measurement method using a semiconductor sensor, a semiconductor sensor, the first to third pre-amplifier respectively connected to the first and second cathode and anode formed on the semiconductor sensor, the first to third pre-amplifier the first to be connected respectively to the three post-amplifier, the incident radiation on the basis of the calculated results from the signal processor and the signal processor by using the signal of the signal and the anode caused by the first and second cathode to calculate the potential difference and the time difference of which can be applied to the position information and energy information controlling application radiation imaging system facing to provide a configuration that includes to determine, reduce the number of components of a radiation imaging system, it is possible to obtain effect of reducing the manufacturing cost.
公开/授权文献:
- KR1020140112955A 반도체 센서를 이용한 방사선 계측 시스템 및 계측 방법 公开/授权日：2014-09-24