基本信息:
- 专利标题： 기계적 테스트 기기의 기기 프로브 및 트랜스듀서 응답을 자동으로 검사하는 방법
- 专利标题（英）：Method for automatically examining an instrument probe and a transducer response of a mechanical testing instrument
- 专利标题（中）：用于自动检查仪器探头和机械测试仪器的传感器响应的方法
- 申请号：KR1020137024188 申请日：2012-02-10
- 公开(公告)号：KR101438472B1 公开(公告)日：2014-09-12
- 发明人： 보드닉데이비드제이. , 드위베디아르핏 , 케러넌루카스폴 , 오클런드마이클데이비드 , 슈미츠로저 , 워런오덴리 , 영크리스토퍼데이비드
- 申请人： 하이지트론, 인코포레이티드
- 申请人地址： **** West **th Street, Eden Prairie, Minnesota *****, U.S.A.
- 专利权人： 하이지트론, 인코포레이티드
- 当前专利权人： 하이지트론, 인코포레이티드
- 当前专利权人地址： **** West **th Street, Eden Prairie, Minnesota *****, U.S.A.
- 代理人： 유미특허법인
- 优先权： US61/441,511 2011-02-10; US61/551,394 2011-10-25
- 国际申请： PCT/US2012/024712 2012-02-10
- 国际公布： WO2012109577 2012-08-16
- 主分类号： G01B5/004
- IPC分类号： G01B5/004 ; G01P21/00 ; G01C9/00 ; G01N3/40
The automated test system comprises a system and method for facilitating the micro (microns) or more of the sample in a small-scale in-line (inline), the production test in the mechanical test machine. In one example, the system includes a probe assembly for changing connect and disconnect the probe of the device. The probe assembly is held changes one of the probes in the probe comprises a probe magazine changing unit configured to connect one of the probe and the instrument probe receptacle. The actuator is connected with the probe changing unit, the actuator moves the probe changing unit is configured to align with the probe unit and the magazine probe receptacle. In another example, the automated testing system includes a multi-DOF stage for aligning the device with the sample test position. The stage includes a stage actuator assembly comprising a sample stage, and the translational actuators and rotary actuators.
公开/授权文献:
- KR1020130117878A 기계적 테스트 기기의 기기 프로브 및 트랜스듀서 응답을 자동으로 검사하는 방법 公开/授权日：2013-10-28
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01B | 长度、厚度或类似线性尺寸的计量；角度的计量；面积的计量；不规则的表面或轮廓的计量 |
| ------G01B5/00 | 以采用机械方法为特征的计量设备 |
| --------G01B5/004 | .用于测量各点的坐标 |