基本信息:
- 专利标题： 오작동 감지 회로
- 专利标题（英）：Circuit for Detecting Mulfunction
- 专利标题（中）：检测多功能电路
- 申请号：KR1020120074548 申请日：2012-07-09
- 公开(公告)号：KR101381725B1 公开(公告)日：2014-04-04
- 发明人： 염선길 , 추연성
- 申请人： (주)신안엔지니어링
- 申请人地址： 경기도 화성시 비봉면 양노남길 **-**
- 专利权人： (주)신안엔지니어링
- 当前专利权人： (주)신안엔지니어링
- 当前专利权人地址： 경기도 화성시 비봉면 양노남길 **-**
- 代理人： 특허법인 다해
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
The present invention relates to a circuit for detecting a malfunction to prevent relates to a connection status, or a malfunction detection circuit, and specifically to a malfunction or unintended disconnection between the two circuits or between devices. Malfunction detection circuit includes a first device 11 and second device 12, a plurality of electrical connection terminals for connection with the (13a, 13b, ..., 13n); The first device 11 and the second unit at least two pre-terminals (14a, 14b) that can be electrically connected (12); A plurality of connection terminal connector (15) mediating the connection between (13a, 13b, ..., 13n); Driving power supply 16 connected to any one of the pre-terminal (14b); Movable means is driven in accordance with the determination whether the connection of at least two pre-terminals (14a, 14b) (17); And an alarm switch (18) connected to the movable means (17).
公开/授权文献:
- KR1020140008593A 오작동 감지 회로 公开/授权日：2014-01-22
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/02 | .对电设备、线路或元件进行短路、断路、泄漏或不正确连接的测试 |