基本信息:
- 专利标题: 평판 패널 검사방법
- 专利标题(英):Method of inspecting plat panel
- 专利标题(中):检查平板的方法
- 申请号:KR1020110093102 申请日:2011-09-15
- 公开(公告)号:KR101306289B1 公开(公告)日:2013-09-09
- 发明人: 손재호 , 이현민 , 강민구 , 이상윤 , 임쌍근
- 申请人: (주) 인텍플러스
- 申请人地址: 대전광역시 유성구 테크노*로 *** (탑립동)
- 专利权人: (주) 인텍플러스
- 当前专利权人: (주) 인텍플러스
- 当前专利权人地址: 대전광역시 유성구 테크노*로 *** (탑립동)
- 代理人: 특허법인 신지
- 主分类号: G01N21/956
- IPC分类号: G01N21/956 ; G01B11/30 ; G02F1/13
It discloses a method for inspecting the flat panel. Flat panel inspection method, by moving at least one of a horizontal flat-panel camera and placing the camera in the measuring position of the flat panel; Step of focusing a camera automatically for the object to be measured from the measured position of the flat panel; Moving the camera in a state where the focus of the camera up and down in the fitted set interval around the current position gamyeo by obtaining a plurality of images for the object to be measured; And select the image with the highest sharpness of the obtained plurality of images of the measured object, and then processes the selected image and a step of determining whether the measured water poor.
公开/授权文献:
- KR1020130029682A 평판 패널 검사방법 公开/授权日:2013-03-25
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
------------G01N21/95 | ...特征在于待测物品的材料或形状 |
--------------G01N21/956 | ....检测物品表面上的图案 |