基本信息:
- 专利标题： 고속 광학 측정 장치
- 专利标题（英）：High speed optical measurement apparatus
- 专利标题（中）：高速光学测量装置
- 申请号：KR1020100053827 申请日：2010-06-08
- 公开(公告)号：KR101195841B1 公开(公告)日：2012-10-30
- 发明人： 이성원 , 진상영 , 문경수
- 申请人： 주식회사 이엔씨 테크놀로지
- 申请人地址： 경기도 화성시 동탄면 동탄산단*길 **
- 专利权人： 주식회사 이엔씨 테크놀로지
- 当前专利权人： 주식회사 이엔씨 테크놀로지
- 当前专利权人地址： 경기도 화성시 동탄면 동탄산단*길 **
- 代理人： 조현석
- 主分类号： G01M11/02
- IPC分类号： G01M11/02 ; G01J1/04
The high-speed optical measurement apparatus. High-speed optical measurement apparatus of the present invention part the optical path to change a light optical path incident from the objective lens unit and the objective lens unit for incident control light to the size of the aggregate total of the object or multiple objects with multiple measurement locations, light traveling the control circuit outputting a control signal to change the direction, by configuring a measuring sensor for measuring the incident light and change a traveling direction in the portion in the light path optical parts alternative lens to match the size and position of the measuring sensor, fast the operating speed and the object in a fixed position, by using the optical measuring sensor optimization face of the display device by shortening the optical measurement time, it is effective to minimize the increase in the product cost of testing in accordance with the screen assembly of a plurality of object.
公开/授权文献:
- KR1020110134056A 고속 광학 측정 장치 公开/授权日：2011-12-14
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01M | 机器或结构部件的静或动平衡的测试；未列入其他类目的结构部件或设备的测试 |
| ------G01M11/00 | 光学设备的测试；其他类目未包括的用光学方法测试结构部件 |
| --------G01M11/02 | .光学性质的测试 |