基本信息:
- 专利标题： 마이크로웨이브를 이용한 ＤＮＡ칩의 프로브 검출장치
- 专利标题（英）：Apparatus for detecting probes in DNA chip using microwave
- 专利标题（中）：用微波检测DNA芯片探针的装置
- 申请号：KR1020100015887 申请日：2010-02-22
- 公开(公告)号：KR101184417B1 公开(公告)日：2012-09-20
- 发明人： 이기진 , 이정하 , 김종철 , 김승완 , 장영수 , 윤영운 , 이한주 , 김태동 , 김정호
- 申请人： 서강대학교산학협력단 , 연세대학교 산학협력단
- 申请人地址： 서울특별시 마포구 백범로 ** (신수동, 서강대학교)
- 专利权人： 서강대학교산학협력단,연세대학교 산학협력단
- 当前专利权人： 서강대학교산학협력단,연세대학교 산학협력단
- 当前专利权人地址： 서울특별시 마포구 백범로 ** (신수동, 서강대학교)
- 代理人： 특허법인충현
- 主分类号： G01N22/00
- IPC分类号： G01N22/00 ; C12Q1/68 ; G01N33/53 ; G01N33/48
Microwave (microwave) discloses an apparatus for detecting a DNA probe from the DNA chip, the DNA probe is irradiated to the strain on the microwave. The spectrum to the distribution pattern with a maximum value at the resonant frequency of the microwave resonator, the microwave resonator to the DNA probe detection device is a microwave source unit for applying generates a microwave, has been the applied microwave proceeds to generate a resonance the probe to examine the DNA probe, the probe and the DNA resonant frequency from the micro-wave deformed by the interaction between the probe, the phase and of the amount of change in reflectivity at least detector that detects one, the applied microwave from said microwave source unit and the modified resonant frequency of the microwave, the phase and wherein from at least one of a change amount of reflectivity DNA central processing unit which generates image data of the probe, and a video output for outputting the image of the shape of the DNA probe from the image data It included. DNA probes can be detected defects on the DNA chip.
公开/授权文献:
- KR1020110096444A 마이크로웨이브를 이용한 ＤＮＡ칩의 프로브 검출장치 公开/授权日：2011-08-30
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N22/00 | 利用微波测试或分析材料 |