基本信息:
- 专利标题： ＬＥＤ의 빔 열화특성 분석방법 및 그 장치
- 专利标题（英）：Analysis method of led beam degradation characteristics and apparatus for the same
- 专利标题（中）：LED光束降解特性分析方法及其设备
- 申请号：KR1020100020873 申请日：2010-03-09
- 公开(公告)号：KR101180622B1 公开(公告)日：2012-09-06
- 发明人： 조재완 , 최영수 , 이재철 , 구인수 , 홍석붕
- 申请人： 한국원자력연구원 , 한국수력원자력 주식회사
- 申请人地址： 대전광역시 유성구 대덕대로***번길 ***(덕진동)
- 专利权人： 한국원자력연구원,한국수력원자력 주식회사
- 当前专利权人： 한국원자력연구원,한국수력원자력 주식회사
- 当前专利权人地址： 대전광역시 유성구 대덕대로***번길 ***(덕진동)
- 代理人： 특허법인 무한
- 主分类号： G01N23/00
- IPC分类号： G01N23/00 ; G21D3/04 ; G01M11/02 ; G01N21/88
The method and apparatus for analysis and a light emission pattern of the LED beam before and after gamma irradiation dose by using the CCD color image is disclosed. Beam deterioration characterization method of the LED according to the invention irradiating the dose gamma radiation and the LED, comprising: obtaining a beam pattern of the obtained and the dose of gamma radiation is irradiated LED, and analyzing the beam pattern of the obtained LED It includes the step of. With this arrangement, there can be seen the effect of high dose irradiation of the gamma ray for each type of LED, a visible-light wireless communication system and ultimately to determine whether a certain amount applied to the sensor / communication within the reactor beonmul.
公开/授权文献:
- KR1020110101688A ＬＥＤ의 빔 열화특성 분석방법 및 그 장치 公开/授权日：2011-09-16
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料，例如X射线、中子 |