基本信息:
- 专利标题: Thermionic emitting electrostatic induction transistor
- 专利标题(中):发热静电感应晶体管
- 申请号:JP15396984 申请日:1984-07-26
- 公开(公告)号:JPS6134979A 公开(公告)日:1986-02-19
- 发明人: NISHIZAWA JUNICHI , MOTOTANI KAORU
- 申请人: Kaoru Mototani , Junichi Nishizawa , Res Dev Corp Of Japan
- 专利权人: Kaoru Mototani,Junichi Nishizawa,Res Dev Corp Of Japan
- 当前专利权人: Kaoru Mototani,Junichi Nishizawa,Res Dev Corp Of Japan
- 优先权: JP15396984 1984-07-26
- 主分类号: H01L29/80
- IPC分类号: H01L29/80 ; H01L29/43 ; H01L29/772
摘要:
PURPOSE:To obtain a thermionic emitting SIT in which carriers can move at a thermionic speed without being subjected to scattering of a crystal lattice, by forming a gate of a semiconductor having a wider forbidden band than a channel while providing a space between the source and the gate less than the mean free path of the carriers. CONSTITUTION:In a compound semiconductor such as GaAs which cannot provide a good insulation film, a gate is not formed of GaAs but of a mixed crystal having a wider forbidden band than GaAs, for example of Ga1-xAlxAs so that the gate is similar to an insulated gate. Further, as shown in the drawing, a channel 2 is provided between a source 3 and a drain 1 so as to pass between gate regions 4. In the channel 2, the distance from the source 3 to the true gate 4 is smaller than a mean free path of electrons, so that an electrostatic transistor of thermionic-emitting type is obtained. The space between and the thickness of the gate regions and the impurity density in the channel region can be altered to provide an either normally-ON or normally-OFF operating transistor. The impurity is preferably undoped so as to inhibit the implantation of electrons.
摘要(中):
目的:为了获得其中载流子能够以热离子速度移动而不会受到晶格散射的热离子发射SIT,通过形成具有比沟道更宽的禁带宽度的半导体栅极,同时在源极和源极之间提供空间, 门小于载体的平均自由路径。 构成:在不能提供良好绝缘膜的化合物半导体例如GaAs中,栅极不由GaAs形成,而是具有比GaAs更宽的禁带宽度的混合晶体,例如Ga1-xAlxAs,使得栅极类似于 绝缘门 此外,如图所示,通道2设置在源极3和漏极1之间,以便在栅极区域4之间通过。在沟道2中,从源极3到真正栅极4的距离小于 电子的平均自由程,从而获得热离子发射型的静电晶体管。 可以改变栅极区域之间的间隙和沟道区域中的杂质浓度,以提供常开或常关的工作晶体管。 杂质优选为未掺杂的,以便抑制电子的注入。
公开/授权文献:
- JPH0614551B2 公开/授权日:1994-02-23
信息查询:
EspacenetIPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01L | 半导体器件;其他类目未包含的电固体器件 |
------H01L29/00 | 专门适用于整流、放大、振荡或切换,并具有至少一个电位跃变势垒或表面势垒的半导体器件;具有至少一个电位跃变势垒或表面势垒,例如PN结耗尽层或载流子集结层的电容器或电阻器;半导体本体或其电极的零部件 |
--------H01L29/02 | .按其半导体本体的特征区分的 |
----------H01L29/68 | ..只能通过对一个不通有待整流、放大或切换的电流的电极供给电流或施加电位方可进行控制的 |
------------H01L29/70 | ...双极器件 |
--------------H01L29/762 | ....电荷转移器件 |
----------------H01L29/80 | .....由PN结或其他整流结栅产生场效应的 |