基本信息:
- 专利标题： 分析装置および分析方法
- 专利标题（英）：ANALYZER AND METHOD FOR ANALYSIS
- 申请号：JP2020096247 申请日：2020-06-02
- 公开(公告)号：JP2021189088A 公开(公告)日：2021-12-13
- 发明人： 佐藤 賢治
- 申请人： 株式会社島津製作所
- 申请人地址： 京都府京都市中京区西ノ京桑原町1番地
- 专利权人： 株式会社島津製作所
- 当前专利权人： 株式会社島津製作所
- 当前专利权人地址： 京都府京都市中京区西ノ京桑原町1番地
- 代理人： 特許業務法人深見特許事務所
- 主分类号： G01N23/223
- IPC分类号： G01N23/223 ; G01T7/00 ; G21K1/06 ; G01N23/20 ; G01N23/2209
To provide a small device that can detect the valence of a target element of a sample and can detect the crystallinity of the sample.SOLUTION: An analyzer 100 includes: an arrangement holder 110 in which a sample S is arranged; an X-ray source 11 for irradiating the sample S with an X-ray; a first detector 141 for detecting a characteristic X-ray generated from the sample S by the application of the X-ray; a second detector 142 for detecting an X-ray diffracted by the sample; and a signal processor 20. The signal processor 20 detects the valence of the target element of the sample on the basis of the characteristic X-ray detected by the first detector 141, and detects crystal information of the sample on the basis of the X-ray detected by the second detector 142.SELECTED DRAWING: Figure 1
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料，例如X射线、中子 |
| --------G01N23/02 | .通过使辐射透过材料 |
| ----------G01N23/223 | ..通过用X射线辐照样品以及测量X射线荧光 |