基本信息:
- 专利标题: 温度測定システム
- 专利标题(英):TEMPERATURE MEASUREMENT SYSTEM
- 申请号:JP2020086024 申请日:2020-05-15
- 公开(公告)号:JP2021179404A 公开(公告)日:2021-11-18
- 发明人: 棚橋 尚貴 , 小森 健太郎
- 申请人: 中部電力株式会社
- 申请人地址: 愛知県名古屋市東区東新町1番地
- 专利权人: 中部電力株式会社
- 当前专利权人: 中部電力株式会社
- 当前专利权人地址: 愛知県名古屋市東区東新町1番地
- 代理人: 恩田 誠; 恩田 博宣
- 主分类号: G01J5/10
- IPC分类号: G01J5/10
To provide a temperature measurement system that can contribute to improvement in temperature measurement accuracy of a measurement object.SOLUTION: A temperature measurement system 10 comprises: a light reception unit 21 that receives radiation light radiated from a measurement object 110; a luminance detection unit 22 that detects luminance in the radiation light of a wavelength corresponding to at least one of a visible light ray or a near infrared ray of the radiation light received by the light reception unit 21; a histogram creation unit that creates a histogram of a gradation and luminance of the radiation light on the basis of the luminance detected by the luminance detection unit 22; a representative luminance detection unit that detects representative luminance from the histogram created by the histogram creation unit; and a temperature calculation unit that calculates a temperature of the measurement object 110 on the basis of the luminance detected by the representative luminance detection unit.SELECTED DRAWING: Figure 1