基本信息:
- 专利标题: Scanning device and method of the radiation beam back scatter imaging
- 申请号:JP2013545014 申请日:2011-04-28
- 公开(公告)号:JP2014500507A 公开(公告)日:2014-01-09
- 发明人: 志強 陳 , 元景 李 , 自然 趙 , 以農 劉 , 万龍 呉 , 麗 張 , 超 塗 , 楽 唐 , 頴康 金 , 碩 曹 , 光偉 丁
- 申请人: 同方威視技術股▲分▼有限公司 , 清華大学
- 专利权人: 同方威視技術股▲分▼有限公司,清華大学
- 当前专利权人: 同方威視技術股▲分▼有限公司,清華大学
- 优先权: CN201010624252 2010-12-31
- 主分类号: G01N23/203
- IPC分类号: G01N23/203
The present invention includes a radiation source, each with a radiation source and a fixed shielding plate and the rotating shield is located between the scanning target, the fixed shielding plate is fixed with respect to the radiation source, the rotating shield is fixed to provide a scanning device is rotatable relative to the shield back scattering imaging for radiation beam. The fixed shielding plate, the radiation beam from the radiation source is disposed radiolucent area allows to pass through the fixing shielding plate, the rotary shield, the radiation incident area and a radiation emission region is disposed respectively, rotating shield in the process of the body is scanned by rotating, radiation transmissive area of fixed shielding plate constitutes a scanning collimated hole radiation incident area and radiation emission region of the rotating shield and continuously intersecting. Radiation transmitting area of the fixed shielding plate is linear slot, rotating shield is cylindrical body, each radiation incident area and a radiation emission region, a series of discrete holes disposed along a spiral line. The present invention further provides a method of scanning a radiation beam back scatter imaging.
公开/授权文献:
- JP5696226B2 バック散乱結像用放射線ビームの走査装置及び方法 公开/授权日:2015-04-08
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/203 | ..通过测量背散射 |