发明专利
JP2012519274A Deformation method of measuring the deformation measurement equipment and structures using the same structures
有权
基本信息:
- 专利标题： Deformation method of measuring the deformation measurement equipment and structures using the same structures
- 申请号：JP2011551993 申请日：2010-03-02
- 公开(公告)号：JP2012519274A 公开(公告)日：2012-08-23
- 发明人： ジョセフ パク , スンジュ ハム , ユンチョル リム , ユンムック リム
- 申请人： テクノバリュー カンパニー リミテッドTechnovalue Co.,Ltd. , 延世大學校産學協力財団Industry−Academic Cooperation Foundation Yonsei University
- 专利权人： テクノバリュー カンパニー リミテッドTechnovalue Co.,Ltd.,延世大學校産學協力財団Industry−Academic Cooperation Foundation Yonsei University
- 当前专利权人： テクノバリュー カンパニー リミテッドＴｅｃｈｎｏｖａｌｕｅ Ｃｏ．，Ｌｔｄ．,延世大學校産學協力財団Ｉｎｄｕｓｔｒｙ−Ａｃａｄｅｍｉｃ Ｃｏｏｐｅｒａｔｉｏｎ Ｆｏｕｎｄａｔｉｏｎ Ｙｏｎｓｅｉ Ｕｎｉｖｅｒｓｉｔｙ
- 优先权： KR20090017317 2009-02-27; KR20090017316 2009-02-27; KR20090017315 2009-02-27
- 主分类号： G01B11/16
- IPC分类号： G01B11/16 ; G01B7/24
【選択図】図１
The present invention relates to a deformation ratio measuring method deformation rate measuring apparatus and structures using the same structure. More specifically, deformation rate measuring apparatus of the structure of the present invention comprises a photonic crystal layer containing nanoparticles arranged at regular intervals. According to the present invention, if a variety of industrial structure has been deformed by, such as the use load, by measuring the structural color change or change in the magnetic flux of the part, more easily, and easily the exact deformation presence and deformation of the structure rate can be measured, thereby preventing the occurrence of accidents due excessive deformation of the structure.
.FIELD 1
公开/授权文献:
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01B | 长度、厚度或类似线性尺寸的计量；角度的计量；面积的计量；不规则的表面或轮廓的计量 |
| ------G01B11/00 | 以采用光学方法为特征的计量设备 |
| --------G01B11/16 | .用于计量固体的变形，例如光学应变仪 |