基本信息:
- 专利标题: Apparatus and method for preparing a microscope specimen
- 申请号:JP2009512270 申请日:2007-05-22
- 公开(公告)号:JP2010511144A 公开(公告)日:2010-04-08
- 发明人: エル. グッドマン、スティーブン
- 申请人: 10エイチ インコーポレイテッド10H,Inc.
- 专利权人: 10エイチ インコーポレイテッド10H,Inc.
- 当前专利权人: 10エイチ インコーポレイテッド10H,Inc.
- 优先权: US74792806 2006-05-22
- 主分类号: G01N1/28
- IPC分类号: G01N1/28 ; G01N1/30 ; G01N1/36
Apparatus for preparing and storing samples for microscopic analysis, methods, and discloses a system. The apparatus by attaching the displacement pipette, providing a reservoir capable of filling the reservoir with reagents desired to prepare a sample for microscopic analysis. In some embodiments, the specimen may be contained in the transmission electron microscope (TEM) grid. In other embodiments, the sample may be a light microscope (LM) specimen or scanning electron microscope (SEM) specimen. Method In yet another embodiment, the present invention relates to an apparatus for preparing a TEM grid, TEM, SEM or LM specimen apparatus for preparing, and the like device to store both the grid and the specimen, for preparing a specimen for microscopic examination to provide. In yet another embodiment, the present invention is to provide long-term storage, the preparation of multiple samples, analysis, and provides a system for tracking the histological evaluation.
公开/授权文献:
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N1/00 | 取样;制备测试用的样品 |
--------G01N1/28 | .测试用样品的制备 |