基本信息:
- 专利标题： AUTOMATIC ANALYSIS DEVICE AND CONTROL METHOD FOR SAME
- 申请号：EP22910805.5 申请日：2022-12-01
- 公开(公告)号：EP4455680A1 公开(公告)日：2024-10-30
- 发明人： TANAKA Shinya , FUNAHASHI Ryosuke , NISHIGAKI Kenichi
- 申请人： HITACHI HIGH-TECH CORPORATION
- 申请人地址： JP Tokyo 105-6409 17-1, Toranomon 1-chome Minato-ku
- 专利权人： HITACHI HIGH-TECH CORPORATION
- 当前专利权人： HITACHI HIGH-TECH CORPORATION
- 当前专利权人地址： JP Tokyo 105-6409 17-1, Toranomon 1-chome Minato-ku
- 代理机构： Strehl Schübel-Hopf & Partner
- 优先权： JP 21210778 2021.12.24
- 国际申请： JP2022044310 2022.12.01
- 国际公布： WO2023120088 2023.06.29
- 主分类号： G01N35/10
- IPC分类号： G01N35/10
摘要：
Provided is an automatic analyzer that is capable of determining a horizontal displacement of a probe by a capacitance type liquid level detection function. The automatic analyzer includes a dispensing mechanism, a capacitance measurement unit, and a control unit. The control unit includes: a liquid level detection unit configured to detect a liquid level of the liquid based on the capacitance measured by the capacitance measurement unit; a peak value calculation unit configured to calculate respective peak values of capacitances caused by a first member and a second member when the dispensing mechanism is driven in the horizontal direction, the first member and the second member being located on one side and the other side of a movement trajectory of the probe and provided at a predetermined interval in a movement direction of the probe; and a position determination unit configured to determine a horizontal position of the probe by comparing a first peak value caused by the first member and a second peak value caused by the second member.
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N35/00 | 不限于用G01N1/00至G01N33/00中任何单独一组提供的方法或材料所进行的自动分析；及材料的传送 |
| --------G01N35/10 | .用于将样品传送给、传送入分析仪器或从分析仪器中输出样品的装置，例如吸入装置、注入装置 |