发明公开
EP4414668A1 GUIDE DEVICE, GUIDANCE METHOD, MEASUREMENT DEVICE, PRODUCT PRODUCTION EQUIPMENT, MEASUREMENT METHOD, PRODUCT PRODUCTION METHOD, AND PRODUCT QUALITY MANAGEMENT METHOD
审中-实审
基本信息:
- 专利标题： GUIDE DEVICE, GUIDANCE METHOD, MEASUREMENT DEVICE, PRODUCT PRODUCTION EQUIPMENT, MEASUREMENT METHOD, PRODUCT PRODUCTION METHOD, AND PRODUCT QUALITY MANAGEMENT METHOD
- 申请号：EP22892593.9 申请日：2022-10-26
- 公开(公告)号：EP4414668A1 公开(公告)日：2024-08-14
- 发明人： MATSUI, Yutaka , TERADA, Kazuki , IMANAKA, Hiroki , UEMATSU, Kento
- 申请人： JFE Steel Corporation
- 申请人地址： JP Tokyo 100-0011 2-3, Uchisaiwai-cho 2-chome Chiyoda-ku
- 专利权人： JFE Steel Corporation
- 当前专利权人： JFE Steel Corporation
- 当前专利权人地址： JP Tokyo 100-0011 2-3, Uchisaiwai-cho 2-chome Chiyoda-ku
- 代理机构： Hoffmann Eitle
- 优先权： JP 21185159 2021.11.12
- 国际申请： JP2022039920 2022.10.26
- 国际公布： WO2023085093 2023.05.19
- 主分类号： G01D21/00
- IPC分类号： G01D21/00 ; G01B11/00 ; G01N29/265
摘要：
A guiding device according to the present invention includes a guiding unit configured to guide a scanning position of a measurement unit with respect to a measurement target when a measurement unit configured to measure a physical quantity of the measurement target performs scanning. The guiding unit includes at least two linear guide markers configured to guide the scanning position, and the at least two linear guide markers are arranged at positions ahead of a measurement position of the measurement unit in a scanning direction at predetermined intervals with the scanning position being interposed therebetween.
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01D | 非专用于特定变量的测量；不包含在其他单独小类中的测量两个或多个变量的装置；计费设备；未列入其他类目的测量或测试 |
| ------G01D21/00 | 未列入其他类目的测量或测试 |